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参数资料
| 型号： | PH28F128W18BD60A |
| 厂商： | INTEL CORP |
| 元件分类： | PROM |
| 英文描述： | 8M X 16 FLASH 1.8V PROM, 60 ns, PBGA56 |
| 封装： | 9 X 11 MM, 1 MM HEIGHT, LEAD FREE, VFBGA-56 |
| 文件页数： | 10/106页 |
| 文件大小： | 1496K |
| 代理商： | PH28F128W18BD60A |
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Intel
Wireless Flash Memory (W18)
Datasheet
Intel Wireless Flash Memory (W18)
07-Dec-2005
Order Number: 290701, Revision: 015
11
2.0
Functional Overview
This section provides an overview of the W18 device features and architecture.
The W18 device provides Read-While-Write (RWW) and Read-White-Erase (RWE) capability
with high-performance synchronous and asynchronous reads on package-compatible densities with
a 16-bit data bus. Individually-erasable memory blocks are optimally sized for code and data
storage. Eight 4-Kword parameter blocks are located in the parameter partition at either the top or
bottom of the memory map. The rest of the memory array is grouped into 32-Kword main blocks.
The memory architecture for the W18 device consists of multiple 4-Mbit partitions, the exact
number depending on device density. By dividing the memory array into partitions, program or
erase operations can take place simultaneously during read operations. Burst reads can traverse
partition boundaries, but user application code is responsible for ensuring that they don’t extend
into a partition that is actively programming or erasing. Although each partition has burst-read,
write, and erase capabilities, simultaneous operation is limited to write or erase in one partition
while other partitions are in a read mode.
Augmented erase-suspend functionality further enhances the RWW capabilities of this device. An
erase can be suspended to perform a program or read operation within any block, except that which
is erase-suspended. A program operation nested within a suspended erase can subsequently be
suspended to read yet another memory location.
After device power-up or reset, the W18 device defaults to asynchronous page-mode read
configuration. Writing to the device’s Read Configuration Register (RCR) enables synchronous
burst-mode read operation. In synchronous mode, the CLK input increments an internal burst
address generator. CLK also synchronizes the flash memory with the host CPU and outputs data on
every, or on every other, valid CLK cycle after an initial latency. A programmable WAIT output
signals to the CPU when data from the flash memory device is ready.
In addition to its improved architecture and interface, the W18 device incorporates Enhanced
Factory Programming (EFP), a feature that enables fast programming and low-power designs. The
EFP feature provides the fastest currently-available program performance, which can increase a
factory’s manufacturing throughput.
The device supports read operations at 1.8 V and erase and program operations at 1.8 V or 12 V.
With the 1.8 V option, VCC and VPP can be tied together for a simple, ultra-low-power design. In
addition to voltage flexibility, the dedicated VPP input provides complete data protection when
VPP ≤ VPPLK.
This device (130 nm) allows I/O operation at voltages lower than the minimum VCCQ of 1.70 V.
This Extended VCCQ range, 1.35 V – 1.8 V, permits even greater system design flexibility.
A 128-bit protection register enhances the user’s ability to implement new security techniques and
data protection schemes. Unique flash device identification and fraud-, cloning-, or content-
protection schemes are possible through a combination of factory-programmed and user-OTP data
cells. Zero-latency locking/unlocking on any memory block provides instant and complete
protection for critical system code and data. An additional block lock-down capability provides
hardware protection where software commands alone cannot change the block’s protection status.
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